Scanning Electron Microscopy and X-Ray Microanalysis

Joseph Goldstein

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  • Editora: UmLivro
  • Ano: 2013
  • ISBN: 9781461349693
  • This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning
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Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

Joseph Goldstein | 2013

Descrição: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning ele... Veja mais

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