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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein
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- Editora: UmLivro
- Ano: 2013
- ISBN: 9781461349693
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning

Descrição: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning ele... Veja mais