Atomic force microscopy, scanning nearfield optical microsc

Gerd Kaupp

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  • Editora: Springer Nature
  • Ano: 2006
  • ISBN: 9783540284055
  • Atomic force microscopy, scanning nearfield optical microsc
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Atomic Force Microscopy, Scanning Nearfield Optical Microsc

Atomic Force Microscopy, Scanning Nearfield Optical Microsc

Gerd Kaupp | 2006

Descrição: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph ... Veja mais

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